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Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions
Journal article   Peer reviewed

Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions

Farag S. Al-Hazmi, Dago M. de Leeuw, A.A. Al-Ghamdi and F.S. Shokr
Optik (Stuttgart), Vol.138, pp.207-213
01/06/2017

Abstract

Dielectric Ellipsometry Nanoparticles Structure

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