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Experimental Investigations for Thermal Mutual Evaluation in Multi-Chip Modules
Journal article   Peer reviewed

Experimental Investigations for Thermal Mutual Evaluation in Multi-Chip Modules

Moez Ayadi, Sihem Bouguezzi, Moez Ghariani and Rafik Neji
JOURNAL OF POWER ELECTRONICS, Vol.14(6), pp.1345-1356
01/11/2014

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology

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