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Experimental investigation and modeling of electrical properties for phenol red thin film deposited on silicon using back propagation artificial neural network
Journal article   Peer reviewed

Experimental investigation and modeling of electrical properties for phenol red thin film deposited on silicon using back propagation artificial neural network

H. A. M. Ali, E. F. M. El-Zaidia and R. A. Mohamed
Chinese journal of physics (Taipei), Vol.67, pp.602-614
01/10/2020

Abstract

Physical Sciences Physics Physics, Multidisciplinary Science & Technology

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