Sign in
Back
Explicit Solution for Critical Thickness of Semicircular Misfit Dislocation Loops In Strained Semiconductors Heterostructures
Journal article   Peer reviewed

Explicit Solution for Critical Thickness of Semicircular Misfit Dislocation Loops In Strained Semiconductors Heterostructures

Chokri Hadj Belgacem
SILICON, Vol.8(3), pp.397-399
01/07/2016
DOI: https://doi.org/10.1007/s12633-015-9281-z

Abstract

Chemistry Chemistry, Physical Materials Science Materials Science, Multidisciplinary Physical Sciences Science & Technology Technology
In terms of the Lambert W function, an exact explicit solution for critical thickness of nucleated semicircular misfit dislocation loops is proposed. The use of the Lambert W function eliminates the need of complex iterative computation. The high precision of the proposed explicit soution is proved by its comparison with the numerical solution.

Metrics

1 Record Views

Details