Factors affecting probability distribution and yield of silicon dioxide defects

Journal article

IEE Proceedings I. Solid-State and Electron Devices, Vol.129, pp.96-102

01/06/1982

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Title: Factors affecting probability distribution and yield of silicon dioxide defects
Creators - without role: A Zakzouk
Publication Details: IEE Proceedings I. Solid-State and Electron Devices, Vol.129, pp.96-102
Identifiers: 9953083708331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article