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Far infrared near normal specular reflectivity of Ni x (SiO 2) 1− x ( x = 1.0, 0.84, 0.75, 0.61, 0.54, 0.28) granular films
Journal article   Peer reviewed

Far infrared near normal specular reflectivity of Ni x (SiO 2) 1− x ( x = 1.0, 0.84, 0.75, 0.61, 0.54, 0.28) granular films

Néstor E. Massa, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, Fernando P. de la Cruz and XiXiang Zhang
Journal of alloys and compounds, Vol.495(2), pp.638-641
2010

Abstract

Electron–phonon interactions Granular films Infrared Light absorption and reflection Oxides

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