Fast and rigorous analysis of EMC/EMI phenomena on electrically large and complex cable-loaded structures

Journal article

Peer reviewed

Hakan Bagci, Ali E Yilmaz, Jian-Ming Jin and Eric Michielssen

IEEE transactions on electromagnetic compatibility, Vol.49(2), pp.361-381

01/05/2007

Abstract

Antennas

Applied sciences

Electric, optical and optoelectronic circuits

Electromagnetic compatibility

Electronic equipment and fabrication. Passive components, printed wiring boards, connectics

Electronics

Exact sciences and technology

Information, signal and communications theory

Radiocommunications

Telecommunications

Telecommunications and information theory

Theoretical study. Circuits analysis and design

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Title: Fast and rigorous analysis of EMC/EMI phenomena on electrically large and complex cable-loaded structures
Creators - without role: Hakan Bagci - University of Michigan–Ann Arbor
Ali E Yilmaz - The University of Texas at Austin
Jian-Ming Jin - University of Illinois Urbana-Champaign
Eric Michielssen - University of Michigan–Ann Arbor
Publication Details: IEEE transactions on electromagnetic compatibility, Vol.49(2), pp.361-381
Publisher: Institute of Electrical and Electronics Engineers
Identifiers: 9941112508331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article