Abstract
The effect of film thickness on the structural and optical properties of bisbenzimidazo [2,1-a:2′,1′-a′] anthrax [2,1,9-def:6,5,10-d′e′f′] diisoquinoline-10,21-dione (BI-diisoQ) films was carried out. The morphology of BI-diisoQ film showed a definite shape of a nanorod with a length of around 5 μm and a diameter of approximately 20 nm. Also, X-ray diffraction patterns demonstrated that BI-diisoQ thin films are characterized by a mixture of amorphous and crystalline structure, whereas the phase-nature crystallization of BI-diisoQ film enhanced as the film thickness increased. The investigation of the absorption coefficient of BI-diisoQ films revealed two indirect allowed band gaps energy. The calculated values of nonlinear optical parameters for BI-diisoQ film were observed to be increased with the increase of film thickness. The optical properties of BI-diisoQ nanorod films indicated that these films have appropriate optical properties, and thus it can be recommended as a promised candidate material in superconductors, optoelectronic and photonic applications.
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•Thermal evaporation technique deposited thin films of BI-diisoQ.•BI-diisoQ films have a nanorod with a diameter approximately 20 nm.•Increasing film thickness enhanced the crystallization of BI-diisoQ film.•BI-diisoQ films are promised material in optoelectronic applications.