Fourier Analysis of Ronchigram and Aberration Assessment

Journal article

Open access

Peer reviewed

K Ishizuka, K Kimoto and Y Bando

Microscopy and microanalysis, Vol.15(S2), pp.1094-1095

07/2009

Abstract

Instrumentation and Techniques

Transmission Electron Microscopy & Scanning Transmission Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

url

https://doi.org/10.1017/S1431927609095348View

Published (Version of record) Open

1 Record Views

Title: Fourier Analysis of Ronchigram and Aberration Assessment
Creators - without role: K Ishizuka - National Institute for Materials Science
K Kimoto - National Institute for Materials Science
Y Bando - National Institute for Materials Science
Publication Details: Microscopy and microanalysis, Vol.15(S2), pp.1094-1095
Publisher: Cambridge University Press
Number of pages: 2
Identifiers: 9949805708331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article