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Fourier Plane Imaging Microscopy for Detection of Plasmonic Crystals with Periods beyond the Optical Diffraction Limit
Journal article   Peer reviewed

Fourier Plane Imaging Microscopy for Detection of Plasmonic Crystals with Periods beyond the Optical Diffraction Limit

Daniel Dominguez, Mdhaoui Alhusain, Nouf Alharbi, Ayrton Bernussi and Luis Grave de Peralta
Plasmonics (Norwell, Mass.), Vol.10(6), pp.1337-1344
01/12/2015

Abstract

Chemistry Chemistry, Physical Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Physical Sciences Science & Technology Science & Technology - Other Topics Technology
Using a simple optical microscope, composed of a plasmonic ultrathin condenser, an objective lens, and a camera, we show that the captured Fourier plane images can provide more information than the real plane images that would be obtained from the corresponding compound microscope. Using this simple Fourier plane imaging approach, we demonstrate that reconstructed non-scanning images of plasmonic crystals with lateral resolution beyond the optical diffraction limit can be obtained.

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