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Fourier plane imaging microscopy
Journal article   Peer reviewed

Fourier plane imaging microscopy

Daniel Dominguez, Nouf Alharbi, Mdhaoui Alhusain, Ayrton A. Bernussi and Luis Grave de Peralta
Journal of applied physics, Vol.116(10), p.103102
14/09/2014

Abstract

Physical Sciences Physics Physics, Applied Science & Technology

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