Free Surface Relaxation and Two-Beam TEM Imaging of Straight Dislocations in Thin Foils

Journal article

Peer reviewed

R. Bonnet, S.Ben Youssef, A. Boussaïd, C.Hadj Belgacem and M. Fnaiech

Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum, Vol.224-225, pp.1-12

01/01/2004

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Title: Free Surface Relaxation and Two-Beam TEM Imaging of Straight Dislocations in Thin Foils
Creators - without role: R. Bonnet - National Polytechnic Institute of Toulouse
S.Ben Youssef
A. Boussaïd
C.Hadj Belgacem
M. Fnaiech
Publication Details: Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum, Vol.224-225, pp.1-12
Identifiers: 9930564508331
Academic Unit: Taibah University
Language: English
Resource Type: Journal article