Abstract
This study aimed to determine the gamma shielding parameters of an Erbium Zinc Tellurite Glass System. The mass attenuation coefficients of Erbium Zinc Tellurite Glass System xEr2O3:20ZnO : (80-x) TeO2 were computed using Monte Carlo simulation at photon energies 20, 30, and 40 keV and 60, 356, 662, 1,173, 1,274, and 1,332 keV. The half-value layer thickness was calculated using the mass attenuation coefficients. The obtained results were compared to standard XCOM data and found comparable. It was found that the erbium zinc tellurite glass with a higher content of erbium is superior shielding material to other glasses. Thus, the validation of a generated Monte Carlo N-Particle Transport Code System-Extended simulation setup has been provided. It can be concluded that results of the present investigation would be very useful for applications of medical diagnostic and nuclear technology.