Sign in
Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
Journal article   Open access  Peer reviewed

Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield

Philomin Juliana, Xinyao He, Jesse Poland, Sandesh Shrestha, Arun K. Joshi, Julio Huerta-Espino, Velu Govindan, Leonardo Abdiel Crespo-Herrera, Suchismita Mondal, Uttam Kumar, …
Frontiers in plant science, Vol.13, pp.835095-835095
03/03/2022
PMID: 35310648

Abstract

2NS translocation Bipolaris sorokiniana CIMMYT grain yield GWAS Plant Science spot blotch wheat
url
https://doi.org/10.3389/fpls.2022.835095View
Published (Version of record) Open

Metrics

1 Record Views

Details