Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Journal article

Peer reviewed

M. Lanza, A. Bayerl, T. Gao, M. Porti, M. Nafria, G. Y. Jing, Y. F. Zhang, Z. F. Liu and H. L. Duan

Advanced materials (Weinheim), Vol.25(10), pp.1440-1444

13/03/2013

PMID: 23280635

Abstract

atomic force microscopy

chemical vapor deposition

electrochemical metallization

graphene

tip wearing

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Title: Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization
Creators - without role: M. Lanza - Peking University
A. Bayerl - Universitat Autònoma de Barcelona
T. Gao - Peking University
M. Porti - Universitat Autònoma de Barcelona
M. Nafria - Universitat Autònoma de Barcelona
G. Y. Jing - Northwest University
Y. F. Zhang - Peking University
Z. F. Liu - Peking University
H. L. Duan - Peking University
Publication Details: Advanced materials (Weinheim), Vol.25(10), pp.1440-1444
Publisher: WILEY-VCH Verlag
Number of pages: 5
Identifiers: 9943052808331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article