Sign in
Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor
Journal article   Peer reviewed

Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor

Stefan Droege, Manea S. Al Khalifah, Mary O'Neill, Huw E. Thomas, Henje S. Simmonds, J. Emyr Macdonald, Matthew P. Aldred, Panos Vlachos, Stuart P. Kitney, Andreas Loebbert, …
The journal of physical chemistry. B, Vol.113(1), pp.49-53
08/01/2009
PMID: 19195100

Abstract

Chemistry Chemistry, Physical Physical Sciences Science & Technology

Metrics

1 Record Views

Details