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Hall effect and electronic structure of Co2FexMn1-xSi films
Journal article   Peer reviewed

Hall effect and electronic structure of Co2FexMn1-xSi films

H. Schneider, E. Vilanova Vidal, S. Chadov, G. H. Fecher, C. Felser and G. Jakob
Journal of magnetism and magnetic materials, Vol.322(6), pp.579-584
01/03/2010

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Condensed Matter Science & Technology Technology

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