Abstract
The present work aims to prepare the nanostructured ZnSe films with high quality onto a fluorine-doped tin oxide glass substrate (FTO/glass) by using the thermal evaporation technique. The X-rays diffraction was used to investigate the structural properties of ZnSe thin films onto FTO glass. The XRD main peaks are corresponding to FTO glass expect the [111], and [311] peaks are related to the ZnSe film. The atomic force microscope supports the nanostructured of the studied films. The linear and nonlinear optical parameters were evaluated and analyzed based on spectroscopic measurements. The dielectric constant and dielectric loss were calculated for ZnSe/FTO thin film. It is clear from the optical analysis and their related refractive index that the nanostructured ZnSe/FTO film has a high refractive index and high third-order nonlinear optical susceptibility. ZnSe/FTO optical system is recommended for the new generation of electronic and optoelectronic devices, especially for telecommunications and nonlinear media.
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