Sign in
High-resolution transmission electron microscopy of cubic Si3N4
Journal article   Peer reviewed

High-resolution transmission electron microscopy of cubic Si3N4

M Zhang, H L He, F F Xu, T Sekine, T Kobayashi and Y Bando
Journal of applied physics, Vol.88(5), pp.3070-3072
01/09/2000

Abstract

Physical Sciences Physics Physics, Applied Science & Technology

Metrics

4 Record Views

Details