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Impact of in situ current stressing on Sn-based solder joint shear stability
Journal article   Peer reviewed

Impact of in situ current stressing on Sn-based solder joint shear stability

Scott Fuller, Mohamed Sheikh, Greg Baty, Choong-Un Kim and Tae-Kyu Lee
Journal of materials science. Materials in electronics, Vol.32(3), pp.2853-2864
01/02/2021

Abstract

Engineering Engineering, Electrical & Electronic Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Technology

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