Implementation of surface roughness scattering in Monte Carlo modeling of thin SOI MOSFETs using the effective potential

Journal article

Peer reviewed

Stephen M Ramey, David K Ferry and Shahid Ramay

IEEE transactions on nanotechnology, Vol.2(2), pp.110-114

01/06/2003

Abstract

Applied sciences

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Transistors

1 Record Views

Title: Implementation of surface roughness scattering in Monte Carlo modeling of thin SOI MOSFETs using the effective potential
Creators - without role: Stephen M Ramey - Arizona State University
David K Ferry - Arizona State University
Shahid Ramay - King Saud University
Publication Details: IEEE transactions on nanotechnology, Vol.2(2), pp.110-114
Publisher: Institute of Electrical and Electronics Engineers
Identifiers: 9948456908331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article