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Improved accuracy and defect detection in contour line determination of multiple-beam Fizeau fringes using Fourier fringe analysis technique
Journal article   Peer reviewed

Improved accuracy and defect detection in contour line determination of multiple-beam Fizeau fringes using Fourier fringe analysis technique

M. A. El-Morsy
Optical and quantum electronics, Vol.52(3)
01/03/2020

Abstract

Engineering Engineering, Electrical & Electronic Optics Physical Sciences Physics Quantum Science & Technology Science & Technology Technology

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