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In-Situ Monitoring of the Solid-State Microstructure Evolution of Polymer: Fullerene Blend Films Using Field-Effect Transistors
Journal article   Peer reviewed

In-Situ Monitoring of the Solid-State Microstructure Evolution of Polymer: Fullerene Blend Films Using Field-Effect Transistors

John G. Labram, Ester Buchaca Domingo, Natalie Stingelin, Donal D. C. Bradley and Thomas D. Anthopoulos
Advanced functional materials, Vol.21(2), pp.356-363
21/01/2011

Abstract

Chemistry Chemistry, Multidisciplinary Chemistry, Physical Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Science & Technology - Other Topics Technology

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