- Title
- In-situ Kelvin probe and ellipsometry study of the doping of a-Si : H and a-SiC : H layers : Correlation with solar cell parameters
- Creators - without role
- A Hadjadj - Laboratory of Physics of Interfaces and Thin FilmsM Favre - Laboratory of Physics of Interfaces and Thin FilmsB Equer - Laboratory of Physics of Interfaces and Thin FilmsP ROCA I CABARROCAS - École Polytechnique
- Publication Details
- Solar energy materials and solar cells, Vol.51(2), pp.145-153
- Publisher
- Elsevier
- Identifiers
- 9932465108331
- Academic Unit
- University Ha'il
- Language
- English
- Resource Type
- Journal article
Journal article
In-situ Kelvin probe and ellipsometry study of the doping of a-Si : H and a-SiC : H layers : Correlation with solar cell parameters
Solar energy materials and solar cells, Vol.51(2), pp.145-153
16/02/1998
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