In situ characterization of anodic silicon oxide films by AC impedance measurements

Journal article

Peer reviewed

P Schmuki, H Böhni and J. A Bardwell

Journal of the Electrochemical Society, Vol.142(5), pp.1705-1712

01/05/1995

Abstract

Chemistry

Electrochemistry

Electrodes: preparations and properties

Exact sciences and technology

General and physical chemistry

Other electrodes

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Title: In situ characterization of anodic silicon oxide films by AC impedance measurements
Creators - without role: P Schmuki - École Polytechnique Fédérale de Lausanne
H Böhni - École Polytechnique Fédérale de Lausanne
J. A Bardwell - Institute for Microstructural Sciences
Publication Details: Journal of the Electrochemical Society, Vol.142(5), pp.1705-1712
Publisher: Electrochemical Society
Identifiers: 9938254908331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article