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In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope
Journal article   Peer reviewed

In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope

D Golberg, M Mitome, K Kurashima, C Zhi, C Tang, Y Bando and O Lourie
Applied physics letters, Vol.88(12), pp.123101-123101-3
20/03/2006

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