Abstract
This paper reports the first systematic study of the structural and optical characterization of Ga3Se4 thin film. Powder X-ray diffractometery analysis revealed that the films are amorphous. Optical reflection and transmittance measurements have been done by UV-visible-near-infrared spectrophotometry, and the values of various optical constants, such as the lower cut-off wavelength (550 nm), optical band gap (2.14 eV), dispersive energy (6.75 eV), oscillator energy (2.86 eV), static refractive index (1.83) and static dielectric constant (3.35), have been estimated. (c) 2013 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.