Abstract
In this article, comprehensive combination of photomodulated optical spectroscopy (PR) and temperature-dependent photoluminescence (PL) is carried out to investigate the electronic energy levels and carrier dynamics in nanometers' size InAs quantum dots (QDs) in different surrounding material. Depending on the temperature range, the integrated PL intensity as a function of temperature, correlated to a rate equation model reveals two thermal escape channels for the InAs QDs in a pure GaAs matrix and three thermal escape channels for InAs/InGaAs dots-in-a-well structure. The extraction of the electronic energy levels by room temperature PR allow analyzing the impact of the surrounding material composition on the thermal activation energies and resulting PL quenching process.