Abstract
•The accelerated life test is used for increasing the reliability in technology.•The ranked set sampling is an efficient alternative to simple random sample.•Inference on accelerated life testing under ranked set sampling reduces the cost.•Inference on ranked set sampling is more efficient than simple random sampling.
In this paper, we considered the inference problem on simple step-stress accelerated life test data from one-parameter exponential distribution under type-I censored ordered ranked set sample with cumulative exposure model. The Bayesian estimators and credible intervals for the model parameters are developed and compared with the corresponding estimators based on simple random sampling. Two real data sets and numerical simulation evaluations are presented to illustrate all the results developed here. The simulation study indicated that the proposed Bayes estimators and credible intervals based on ordered ranked set sampling performed better than their counterparts using simple random sampling.