Abstract
The radiation shielding features of the ternary oxyfluoride tellurite glasses were studied by calculating different shielding factors. The effect of the TeO
2
, WO
3,
and ZnF
2
on the tested glass system’s attenuating performance was predicted from the examination. The mass attenuation coefficient (µ/ρ) values for the oxyfluoride tellurite glasses depend highly on the concentration of WO
3,
as well as ZnF
2
. All the present ZnFWTe1-ZnFWTe5 samples have higher µ/ρ values than that of the pure TeO
2
glass at all energies. For the samples with a fixed content of WO
3
, the replacement of TeO
2
by ZnF
2
increases the µ/ρ, while for the glasses with a fixed content of TeO
2
, the replacement of WO
3
by ZnF
2
results in a decline in the µ/ρ values. The results revealed that ZnFWTe4 has the lowest linear attenuation coefficient (µ) among the oxyfluoride tellurite glasses, whereby it has a slightly higher value than pure TeO
2
glass. The maximum effective atomic number (Z
eff
) is found at 0.284 MeV and varied between 31.75 and 34.30 for the tested glasses; it equaled to 30.29 for the pure TeO
2
glass. The half-value layer (HVL) of the glasses showed a gradual decline with increasing density. The pure TeO
2
was revealed to have thicker HVL than the selected oxyfluoride tellurite glasses. A 1.901-cm thickness of the sample, ZnFWTe1, is required to decrease the intensity of a photon with an energy of 0.284 MeV to one-tenth of its original, whereas 1.936, 1.956, 2.212, and 2.079 cm are required for glasses ZnFWTe2, ZnFWTe3, ZnFWTe4, and ZnFWTe5, respectively.