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Influence of the Active Layer Material Quality and Doping Profile on the ZnO-Based MSM-PD's Performance
Journal article   Open access  Peer reviewed

Influence of the Active Layer Material Quality and Doping Profile on the ZnO-Based MSM-PD's Performance

Najeeb Al-Khalli, Mohamed Aboud and Nacer Debbar
IEEE access, Vol.7, pp.74231-74237
2019

Abstract

Doping profiles Electric fields II-VI semiconductor materials Mathematical model Metal-semiconductor-metal photodiode numerical simulation responsivity Semiconductor process modeling temporal response Zinc oxide ZnO
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https://doi.org/10.1109/ACCESS.2019.2920321View
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