Abstract
•MnTPPCl films were deposited on quartz substrates by evaporation technique.•DSC, FTIR and optical constants of MnTPPCl were studied.•It was found that the energy gap, Eg, affected by the film thickness and annealing.•The third-order nonlinear susceptibility, χ(3), and the nonlinear refractive index, n2, were calculated.
Thin films of manganese (III) chloride 5,10,15,20-tetraphenyl-21H,23H-porphine (MnTPPCl) with different film thickness were deposited by an evaporation technique. Some optical constants were calculated for these films at a thickness of 110, 220 and 330nm and annealing temperature of 373 and 437K. IR spectrum demonstrating that the thermal evaporation method is a good one to acquire undissociated and stoichiometric MnTPPCl films. Our perceptions demonstrate that the mechanism of the optical absorption obeys with the indirect transition. It was found that the energy gap, Eg, affected by the film thickness and annealing. Dispersion of the refractive index is described using single oscillator model. Dispersion parameters are calculated as a function of the film thickness and annealing temperature. In addition, the third-order nonlinear susceptibility, χ(3), and the nonlinear refractive index, n2, were calculated.