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Integration process for photonic integrated circuits using plasma damage induced layer intermixing
Journal article   Peer reviewed

Integration process for photonic integrated circuits using plasma damage induced layer intermixing

B. S Ooi, A. C Bryce and J. H Marsh
Electronics letters, Vol.31(6), pp.449-451
16/03/1995

Abstract

Applied sciences Electronics Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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