Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films

Alaa Ahmed Akl; I.M. El Radaf; Ahmed Saeed Hassanien

doi:10.1016/j.spmi.2020.106544

$Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films$

Journal article

Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films

Alaa Ahmed Akl, I.M. El Radaf and Ahmed Saeed Hassanien

Superlattices and microstructures, Vol.143, p.106544

07/2020

DOI: https://doi.org/10.1016/j.spmi.2020.106544

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Title: Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films
Creators - without role: Alaa Ahmed Akl - Shaqra University
I.M. El Radaf - National Research Centre
Ahmed Saeed Hassanien - Benha University
Publication Details: Superlattices and microstructures, Vol.143, p.106544
Identifiers: 9928694508331
Academic Unit: Qassim University; Shaqra University
Language: English
Resource Type: Journal article