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Interface Engineering for Precise Threshold Voltage Control in Multilayer‐Channel Thin Film Transistors
Journal article   Peer reviewed

Interface Engineering for Precise Threshold Voltage Control in Multilayer‐Channel Thin Film Transistors

Advanced materials interfaces, Vol.3(24), pp.1600713-n/a
01/12/2016

Abstract

hafnium oxide multilayers thin film transistors threshold voltage zinc oxide
Multilayer channel structure is used to effectively manipulate the threshold voltage of zinc oxide transistors without degrading its field‐effect mobility. Transistors operating in enhancement mode with good mobility are fabricated by optimizing the structure of the multilayer channel. The optimization is attributed to the formation of additional channel and suppression of the diffusion of absorbed water molecules and oxygen vacancies.

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