- Title
- Interface analysis of Si-Al-O-N materials by a 300kV FE-TEM
- Creators - without role
- F F XuC M WangY BandoM Mitomo
- Contributors - without role
- D B WilliamsR Shimizu
- Publication Details
- Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000, (165), pp.163-164
- Series
- INSTITUTE OF PHYSICS CONFERENCE SERIES
- Publisher
- Iop Publishing Ltd
- Number of pages
- 2
- Identifiers
- 9951610008331
- Academic Unit
- King Saud University
- Language
- English
- Resource Type
- Journal article
Journal article
Interface analysis of Si-Al-O-N materials by a 300kV FE-TEM
Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000, (165), pp.163-164
INSTITUTE OF PHYSICS CONFERENCE SERIES
01/01/2000
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