Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation

Journal article

Peer reviewed

International journal of numerical modelling, Vol.24(4), pp.335-344

07/2011

Abstract

dark characteristics

MSM photodetector

numerical simulation

semiconductor devices

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Title: Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation
Creators - without role: Nacer Debbar - King Saud University
Publication Details: International journal of numerical modelling, Vol.24(4), pp.335-344
Publisher: John Wiley & Sons, Ltd
Number of pages: 10
Identifiers: 9947875508331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article