Abstract
Reliability data are generated in the form of success/failure. An attempt was made to model such type of data using binomial distribution in the Bayesian paradigm. For fitting the Bayesian model both analytic and simulation techniques are used. Laplace approximation was implemented for approximating posterior densities of the model parameters. Parallel simulation tools were implemented with an extensive use of R and JAGS. R and JAGS code are developed and provided. Real data sets are used for the purpose of illustration.