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Langmuir probe and optical emission spectroscopy studies for RF magnetron sputtering during TiON thin film deposition
Journal article   Peer reviewed

Langmuir probe and optical emission spectroscopy studies for RF magnetron sputtering during TiON thin film deposition

A. E. Metawa, F. M. El-Hossary, M. Raaif, M. SalahEl-Deen and A. A. Abd El-Moula
Chinese journal of physics (Taipei), Vol.68, pp.168-177
01/12/2020

Abstract

Physical Sciences Physics Physics, Multidisciplinary Science & Technology

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