Abstract
Optical and dispersion properties can be altered by incorporating Ni@SiO2 nanoparticles on poly-methyl methacrylate (PMMA) for optoelectronic applications. The Ni@SiO2/PMMA nanocomposite films were prepared by the casting method. The morphology of the prepared nanoparticles was examined through a High-resolution transition electron microscope (HRTEM), it showed the formation of nickel core-shell @ silica. Furthermore, the homogenous distribution of Ni@SiO2/PMMA was confirmed by X-ray mapping. The linear optical properties revealed that the absorption coefficient, extinction coefficient, refractive index, real and imaginary part of dielectric constants, and the optical conductivity increased with increasing the incorporation of Ni@SiO2 nanoparticles on poly-methyl methacrylate (PMMA). Likewise, volume and surface energy loss functions (VELF and SELF) increased with increasing Ni@SiO2 in the PMMA matrix. The values of dispersion energy E-d, static refractive index no, lattice dielectric constant epsilon(l), and high dielectric constant epsilon(infinity) increased as the filler increased while the single oscillator energy E-o and oscillator strength decreased. Both the linear optical susceptibility and the parameter of nonlinear optical properties such as third nonlinear optical susceptibility, nonlinear refractive index n(2), and nonlinear absorption coefficient are found to be a function of Ni@SiO2 contents. Furthermore, the electrical susceptibility and relative permittivity increased as the Ni@SiO2 contents increased in the PMMA matrix. So, Ni@SiO2/PMMA matrix has been considered as promising nanocomposites for flexible optoelectronic applications.