Abstract
Thin films of manganese phthalocyanine chloride (MnPcCl) were prepared using a thermal deposition onto a polyacetate sheet substrate. The structure analyses of the obtained MnPcCl thin films of different thicknesses ranging from 55 to 125 nm were investigated using the X-ray diffraction technique. The transmittance and reflectance of MnPcCl thin films were measured at the normal incident light in the 200-2500 nm wavelength range. The absorption coefficient analysis revealed that the films were characterized by indirect allowed transition with two energy gaps. The Wemple-DiDomenico single oscillator model explained the refractive index's dispersion behavior, and dispersion parameters were calculated. The third-order nonlinear optical susceptibility (chi(3)) and nonlinear refractive index (n2) were determined using Miller's principles. Optical limiting behavior was estimated using the He-Ne (633 nm) and green (533 nm) lasers power. The obtained results indicate that MnPcCl films are excellent nonlinear optical materials for optical limiters.