Abstract
Thickness relying on linear and nonlinear optical properties of tin sulfide thin films has been studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study. Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the wavelength range 300–1100 nm. Linear optical properties of thin films indicate let direct and indirect transition type and the band gap increased with film thickness. The third order nonlinear optical susceptibility χ3 and nonlinear refractive index n2 has been determined by mathematical calculation.