Abstract
Er-doped CdO thin films are coated on FTO substrates using so-gel-spin coater technique. XRD studies confirm the polycrystalline nature of (111) orientation of the films. Crystallite size, dislocation density, and Lattice strain is calculated from XRD data and found that they are varying with doping percentage. AFM studies revealed homogeneous distributions of the nano-grains of 13-19 nm size. Energy dispersive spectroscopy and mapping analyses confirm the elemental composition. All the films are showing high transmission of nearly 80% in the visible spectrum. The calculated direct, indirect band gap values are changing with a variation of doping from 2.85 to 2.97 eV. At higher wavelength, the dielectric constant values are in the range of 20-80. The linear, third-order susceptibilities and nonlinear refractive index values are varying from 2 to 7, 1.6x10(-13) to 5.41x10(-13) esu and 1.39x10(-12) to 8.1x10(-11) esu respectively.