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Linearization of a nickel resistance temperature detector and its application in temperature measurement
Journal article   Peer reviewed

Linearization of a nickel resistance temperature detector and its application in temperature measurement

ANWAR A. Khan, A. R. M. Alamoud and M. A. AL-TURAIGI
International journal of electronics, Vol.67(6), pp.931-936
01/12/1989

Abstract

A theoretical study of a nickel resistance temperature detector (RTD) response linearization incorporating a new scheme, as well as conventional methods, is presented. The proposed scheme exhibits superior performance over conventional methods and offers linear temperature/voltage conversion over a wide dynamic range.

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