Low-Dose Electron Microscopy Imaging of Electron Beam-Sensitive Crystalline Materials

Journal article

Peer reviewed

Jia Lv, Hui Zhang, Daliang Zhang, Lingmei Liu and Yu Han

Accounts of materials research, Vol.3(5), pp.552-564

27/05/2022

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Title: Low-Dose Electron Microscopy Imaging of Electron Beam-Sensitive Crystalline Materials
Creators - without role: Jia Lv - Chongqing University
Hui Zhang - King Abdullah University of Science and Technology
Daliang Zhang - Chongqing University
Lingmei Liu - Chongqing University
Yu Han - King Abdullah University of Science and Technology
Publication Details: Accounts of materials research, Vol.3(5), pp.552-564
Identifiers: 9943915108331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article