Abstract
In the current work, Cu2-xSxO(x = 0.05, 0.1 and 0.2) and Cu2-yCryO (y = 0.03 and 0.06) composite thin films were deposited on a heated glass substrate using spray pyrolysis technique. The effect of S and Cr doping on microstructure, crystal defects and mechanical properties of Cu2O nanoparticles was studied. X-ray diffraction results reveal that the single phase of Cu2O has a cubic structure without any other phases related S and Cr. Scherrer and Williamson and Hall methods were used to determine the parameters of the microstructure by analyzing the X-ray diffraction line profile. Some important parameters such as crystallite size, microstrain, average residual stress, number of crystallite/cm(2) and dislocation density were studied. Analysis of microstructure and crystal imprefications revealed that all the parameters studied were increased by increasing the concentration of S in Cu2-xSxO; conversely, when adding a Cr element to Cu2-yCryO. The Mechanical properties of the films was observed by ultrasonic technique deduced that the doping of Cu2O thin film with S caused good quality of crystallinity. The doped films can be used for optoelectronic applications.