Sign in
MULTIFREQUENCY TRANS-ADMITTANCE SCANNER: MATHEMATICAL FRAMEWORK AND FEASIBILITY
Journal article   Peer reviewed

MULTIFREQUENCY TRANS-ADMITTANCE SCANNER: MATHEMATICAL FRAMEWORK AND FEASIBILITY

Sungwhan Kim, Jeehyun Lee, Jin Keun Seo, Eung Je Woo and Habib Zribi
SIAM journal on applied mathematics, Vol.69(1), pp.22-36
01/01/2008

Abstract

Mathematics Mathematics, Applied Physical Sciences Science & Technology

Metrics

1 Record Views

Details