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Machine learning approach of detecting anomalies and forecasting time-series of IoT devices
Journal article   Open access  Peer reviewed

Machine learning approach of detecting anomalies and forecasting time-series of IoT devices

Amer Malki, El-Sayed Atlam and Ibrahim Gad
Alexandria engineering journal, Vol.61(11), pp.8973-8986
01/11/2022

Abstract

Engineering Engineering, Multidisciplinary Science & Technology Technology
url
https://doi.org/10.1016/j.aej.2022.02.038View
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