Abstract
Epitaxial La0.7Ca0.3Mn0.95Co0.05O3 (LCMCO) thin films were prepared on (1 0 0) LaAlO3 single-crystal substrates by pulsed laser deposition (PLD). We have been studied using X-ray diffraction (XRD), electrical transport magneto-transport and dc magnetization. XRD pattern reflects that all films have c-axis epitaxial growth on LaAlO3 substrates. The decrease in out-of-plane cell parameter specifies a progressive relaxation of in the plane compressive strain as the thickness film is increases. From the dc magnetization measurements, it is observed that ferromagnetic to paramagnetic transition temperature increases with increase in the film thickness. Magneto-resistance and temperature coefficient of resistance increases with thickness of film and have maximum value near its metal to insulator transition temperature. (C) 2011 Elsevier Ltd and Techna Group S.r.l. All rights reserved.