Abstract
An important problem in reliability analysis and in testing of digital circuits is the problem of deriving the partial derivative (Boolean difference) of a swithching (Boolean) function. This problem is tackled herein by a divide and conquer technique that relies on the use of a recently developed minimization procedure via the variable-entered Karnaugh map (VEKM). This technique is simple, systematic, and can handle switching functions of moderate complexity. Two detailed examples are given to illustrate the derivation of non conventional Boolean differences as well as single and multiple conventional ones.